Researchers at the University of Minnesota and the University of Arizona have provided new insights into how next-generation electronics break down or degrade over time. Using a sophisticated electron microscope, the researchers looked at the nanopillars within magnetic tunnel junctions – the building blocks for the non-volatile memory in smart watches and in-memory computing. The researchers ran a current through the device to see how it operates. As they increased the current, they were able to observe how the device degrades and eventually dies in real time. “What was unusual with this discovery is that we observed this burn out at a much lower temperature than what previous research thought was possible,” said Andre Mkhoyan, one of the scientists involved in this research.
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